The top Automated Test Equipment manufacturers count on Circuit Check. We fabricate and customize in-circuit fixtures for testers made by Agilent Technologies, GenRad, Teradyne and others.
 

Customers know they can come to us for the latest technology and the utmost precision. For example, our engineers developed Fixture Design Assistant, a proprietary program suite that translates electronic files into automated instructions for fixture fabrication. Each fixture is carefully designed for contacting test targets. We routinely use spring probes to contact BGAs, Micro BGAs and micro vias as small as 0.012, and test pads as small as 0.018 on both the top and bottom of circuit boards.

When spring-loaded probes aren't practical, we use Thru-Connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented by a number of methods: spring probes, mating connectors, sacrificial SMT connectors, and stabber cards. We have used stabber cards for SCSI, PCI, PCMCIA, AGP, DIMM, and Slot 1 and 2 connectors.

We offer a variety of options for obtaining desired test coverage

• Vacuum covers
• Heavy-duty gates
• Button and switch actuation
• Pneumatic and manual drive side-contacting units
  
• Pneumatic drive fixtures
• Manual drive fixtures
• Automated Board Handler fixtures built to OEM standards for Pematech, IPTE and TSL

When high speed signal measurements and large node count boards are required, Wireless Test Fixtures are the answer. A printed circuit board with double-ended receptacles eliminates the wire bulk and improves test performance. For a complete guide to what materials are required for the fabrication of wireless test fixtures, please click here: Required Materials Guide (PDF Format).

Our engineering department designs the wireless board in-house for Agilent Technologies and GenRad interfaces.Our Automated Verification System checks wiring in all in-circuit test fixture for correct probe locations wired to the interface, shorts to other locations and shorts between power and ground planes.

Moving Test ahead through Innovation

• "Dual Check™" Vacuum Bi-Level fixtures

  Circuit Check introduces a Bi-Level technology that is unique to the industry. This design eliminates the need for any external air or power supply connections. Your test program controls the "Bi-Level" test states using the tester's vacuum ports. There are no mechanical linkages that will malfunction, no levitation of plates, just plain vacuum.   Long stroke probes contact the bottom of your board during the functional or isolation test. Standard stroke probes can contact both top and bottom during the in-circuit portion of the test. Our design allows up to 400 of the long stroke probes, while your tester is the limiting factor for the standard stroke probes.
  		The "Dual Check™" Bi-Level fixture is X-Probe compatible for 75, 50 and 39 mil center test pads.   The "Dual Check™" Bi-Level fixture is available for all testers that have multiple vacuum ports.   The "Dual Check™" design is protected by US Patent # 7,200,509.

• "Quick Check™" Interface

Circuit Check has developed a consistent and cost effective process for marking the interface to quickly and accurately locate populated P-Pins. Previuosly, populated interface locations were difficult to quickly identify as seen below.   Circuit Check's patented "Quick Check™" easily differentiates the populated locations from non-populated locations. Now, during your debug process you can quickly get down to business and not have to worry about whether the interface is correctly loaded. The results are like night and day. The "Quick Check™" interface is accurate, reliable and does not affect the fixture lead times.
Typical Standard Marked Interface	Circuit Check's patented "Quick Check™" Interface
The "Quick Check™" design is protected by US Patent # 7,592,796.