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ICT Test Development

Trust our Test Engineering Department -with nearly 50 years of test programming experience- to provide a turnkey solution for your Teradyne Z18xx, Spectrum 88xx, GenRad 228x, and TestStation testers. We can provide the test program, test fixture and installation for North America and Asia in one seamless operation.

Test generation accommodates

  • Device modeling
  • CRC/memory testing
  • SCAN testing
  • Test coverage analysis
  • Data buss testing
  • CBTest tools
  • Component modeling
  • Frame Scan
  • Boundary Scan development and testing

Our staff can also

  • Perform testability reviews
  • Perform data logging evaluations
  • Migrate current GR227x programs to the latest GenRad 228x platforms
  • Provide Teradyne Z18xx program conversion to TestStation
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